Microscopy 101: Scanning Probes or Scanning Electrons: A Practical Guide to Select a Method for Nanoscale Characterization
نویسندگان
چکیده
منابع مشابه
Field Ion Microscopy for the Characterization of Scanning Probes
Scanning probe microscopy (SPM) is a widely used tool for investigating the nanoscale structure of materials, as well as their electronic and mechanical properties with its related spectroscopic modes of operation. In SPM experiments, the sharp tip which probes the material under investigation is usually uncharacterized; however, its geometry and chemical composition play a large role in the SP...
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A soft stylus microelectrode probe has been developed to carry out scanning electrochemical microscopy (SECM) of rough, tilted, and large substrates in contact mode. It is fabricated by first ablating a microchannel in a polyethylene terephthalate thin film and filling it with a conductive carbon ink. After curing the carbon track and lamination with a polymer film, the V-shaped stylus was cut ...
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Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...
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Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2019
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929519001044